Cryogenic Probe Station
Closed-cycle on-wafer DC, pulsed, noise and RF characterization from cryogenic temperatures upward
Lake Shore Cryotronics station, Sumitomo F-70 helium compressor, Model 336 temperature controllers
Facility & Equipment
The lab measures transistors on-wafer from liquid-helium temperature upward, and models them with industry-standard EDA tools.
Temperature Range
Our setups together cover 4 K to 1000 K, from liquid-helium cryogenics to high-temperature operation. Each measurement method has its own usable window within that range.
Characterization envelope · temperature (K), log scale
Instruments & Tools
Probe Stations
Shielded on-wafer probing and temperature-controlled measurements up to high temperature
Cascade Microtech MicroChamber stations with FormFactor DPP210 positioners; TMP vacuum probe chamber
DC & High-Voltage Pulsed I–V
Dynamic on-resistance, quiescent-bias and pulse-width studies, self-heating
Keysight B1500A with HV-SPGU
DC Parameter Analysis
Output/transfer curves, gate leakage, impact-ionization hole current
Keysight 4156C
Current-mode DLTS
Trap capture/emission kinetics, current collapse and recovery
Isothermal I-DLTS
Low-Frequency Noise
1/f and G–R noise spectra, trap activation energies
SR570 Current Preamp + 35670A Signal Analyzer
RF Small-Signal Measurement
Calibrated, de-embedded S-parameters; equivalent-circuit extraction
VNA up to 67 GHz
Device Modeling
ASM-HEMT parameter extraction from DC, pulsed and S-parameter data
Keysight IC-CAP
Circuit Simulation
Small-signal models, measured vs. modeled S-parameters
Keysight ADS
In the Lab
